Dr .He Jin received the B.S, M.S and Ph. D degrees, all in microelectronics and solid-state electronics from Tianjin University in 1988 and University of Electronic Science and Technology of China (UESTC) in 1993 and 1999, respectively. He had worked in Institute of Microelectronics of Peking University as a post-doctoral from Sept,1999 to Aug., 2001 and as an associated professor from Aug.,2001 to Dec., 2001. He has been a visiting scholar and then research scientist in the Department of Electrical Engineering and Computer Sciences, University of California at Berkeley, CA, USA from Dec., 2001 to Aug., 2005(J-1 and H1-B). He has been a full professor of Peking University since Aug., 2005 to now.
Dr. He’s research interests lie in the general area of MOSFET compact modeling, characterization of MOSFETs and parameter extraction, MOSFET’s reliability issues, power device and smart power IC, new structure development of the deep nanoscale MOSFET. As the author and co-author, he has published the peer reviewed academic paper more than 300 in the international journals such as the IEEE. Electron Device Letters(EDL),IEEE. Transactions on Electron Devices(T-ED),Semiconductor Science and Technology,Solid State Electronics, International Journal of Electronics, and six chapter books.